Supported by the National Science Foundation’s Advanced Technological Education (NSF ATE) program, HI-TEC is a national conference on advanced technological education where secondary and postsecondary educators, counselors, industry professionals, trade organizations, and technicians can update...
Featured
This classroom module will give students an introduction to reporting data for test specimens in additive manufacturing, specifically, identifying test specimen report forms, understanding the data contained on those forms, and "the physical alignment for test specimens in the build box for proper building for testing." This lesson is intended to be delivered primarily through a lecture and class discussion format and should take approximately 1 hour. Evaluation questions are included, and the information can be adapted high school and early college students.
![Screenshot](https://archives.internetscout.org/local/data/caches/images/scaled/img_00006318_300x300.png)
Events
Updates
We are excited to announce the release of the ATE Impacts 2022-2023 book. Copies can be ordered online through the ATE Impacts website, and digital copies of the book can be accessed there as well. The digital copies are viewable across all devices....